Section He-P 4043.03 - Definitions(a) "Analytical x-ray equipment" means equipment used for x-ray diffraction or fluorescence analysis.(b) "Analytical x-ray system" means a group of components utilizing x-rays to determine the elemental composition or to examine the microstructure of materials.(c) "Fail-safe characteristics" mean a design feature which causes beam port shutters to close, or otherwise prevents emergence of the primary beam, upon the failure of a safety or warning device.(d) "Fixed gauge" means devices that are installed by design to monitor/measure the level of the contents of vessels or tanks.(e) "Hybrid gauge" means a gauging device utilizing both x-ray and radioactive material sources.(f) "Local components" mean part of an analytical x-ray system and include areas that are struck by x-rays such as radiation source housings, port and shutter assemblies, collimators, sample holders, cameras, goniometers, detectors, and shielding, but do not include power supplies, transformers, amplifiers, readout devices, and control panels.(g) "Normal operating procedures" mean step-by-step instructions necessary to accomplish the analysis. These procedures shall include sample insertion and manipulation, device alignment, routine maintenance by the registrant or licensee, and data recording procedures, which are related to radiation safety.(h) "Open-beam configuration" means an analytical x-ray system in which an individual could accidentally place some part of his body in the primary beam path during normal operation.(i) "Primary beam" means ionizing radiation which passes through an aperture of the source housing by a direct path from the x-ray tube or a radioactive source located in the radiation source housing.(j) "Safety device" means a device which prevents the entry of any portion of an individual's body into the primary x-ray beam path or which causes the beam to be shut off upon entry into its path.(k) "Scanning Electron Microscope (SEM) " means electronic equipment that produces radiation incidental to its operation and which is not exempt from registration under the provision of He-P 4040.05(a) . The term includes "transmission electron microscope."(l) "X-ray gauge" means a radiation generating device designed and manufactured for the purpose of detecting, measuring, gauging or controlling thickness, density level or interface location.N.H. Admin. Code § He-P 4043.03
#6827, eff 8-6-98; ss by #8692, INTERIM, eff 7-27-06, EXPIRES: 2-2-07; ss by #8808, eff 1-24-07
Amended byVolume XXXV Number 14, Filed April 9, 2015, Proposed by #10804, Effective 3/26/2015, Expires3/26/2025.