La. Admin. Code tit. 33 § XV-802

Current through Register Vol. 50, No. 11, November 20, 2024
Section XV-802 - Definitions
A. The definition of some terms used in this Chapter may be found in Chapter 6.

Analytical X-Ray Equipment- equipment used for X-ray diffraction or fluorescence analysis.

Analytical X-Ray System- a group of components utilizing X-rays to determine the elemental composition or to examine the microstructure of materials.

Fail-Safe Characteristics- design features which cause beam port shutters to close or which otherwise prevent emergence of the primary beam upon the failure of a safety or warning device.

Local Components- part of an analytical X-ray system and include areas that are struck by X-rays, such as radiation source housings, port and shutter assemblies, collimators, sample holders, cameras, goniometers, detectors and shielding, but do not include power supplies, transformers, amplifiers, readout devices and control panels.

Normal Operating Procedures-step -by-step instructions necessary to accomplish analysis. These procedures shall include sample insertion and manipulation, equipment alignment, routine maintenance by the registrant or licensee, and data recording procedures which are related to radiation safety.

Open-Beam Configuration- an analytical X-ray system in which an individual could accidentlly place some part of his body in the primary beam path during normal operation.

Primary Beam- ionizing radiation which passes through an aperture of the source housing by a direct path from the X-ray tube or a radioactive source located in the radiation source housing.

La. Admin. Code tit. 33, § XV-802

Promulgated by the Department of Environmental Quality, Nuclear Energy Division, LR 13:569 (October 1987).
AUTHORITY NOTE: Promulgated in accordance with R.S. 30:2001 et seq.