Ex Parte WE et alDownload PDFPatent Trial and Appeal BoardAug 31, 201714450201 (P.T.A.B. Aug. 31, 2017) Copy Citation United States Patent and Trademark Office UNITED STATES DEPARTMENT OF COMMERCE United States Patent and Trademark Office Address: COMMISSIONER FOR PATENTS P.O.Box 1450 Alexandria, Virginia 22313-1450 www.uspto.gov APPLICATION NO. FILING DATE FIRST NAMED INVENTOR ATTORNEY DOCKET NO. CONFIRMATION NO. 14/450,201 08/01/2014 Hong Bok WE QC143271 1980 12371 7590 09/05/2017 Mnnrv rre.issle.r Olrk & T owe P P /OT TAT POMM EXAMINER 4000 Legato Road, Suite 310 Fairfax, VA 22033 PAREKH, NITIN ART UNIT PAPER NUMBER 2811 NOTIFICATION DATE DELIVERY MODE 09/05/2017 ELECTRONIC Please find below and/or attached an Office communication concerning this application or proceeding. The time period for reply, if any, is set in the attached communication. Notice of the Office communication was sent electronically on above-indicated "Notification Date" to the following e-mail address(es): meo.docket@mg-ip.com meo@mg-ip.com ocpat_uspto@qualcomm.com PTOL-90A (Rev. 04/07) UNITED STATES PATENT AND TRADEMARK OFFICE BEFORE THE PATENT TRIAL AND APPEAL BOARD Ex parte HONG BOK WE, DONG WOOK KIM, JAE SIK LEE, KYU-PYUNG HWANG, and YOUNG KYU SONG Appeal 2017-001494 Application 14/450,201 Technology Center 2800 Before ADRIENE LEPIANE HANLON, JENNIFER R. GUPTA, and DEBRA L. DENNETT, Administrative Patent Judges. HANLON, Administrative Patent Judge. DECISION ON APPEAL A. STATEMENT OF THE CASE The Appellants filed an appeal under 35 U.S.C. § 134(a) from an Examiner’s decision finally rejecting claims 1—6. According to the Final Office Action dated January 21, 2016 (“Final Act.”), claims 7—20 are also pending but have been withdrawn from consideration. We have jurisdiction under 35 U.S.C. § 6(b). We AFFIRM. Appeal 2017-001494 Application 14/450,201 Claims 1 and 2 are reproduced below from the Claims Appendix of the Appeal Brief dated June 21, 2016 (“App. Br.”). The limitations at issue are italicized. 1. A packaged semiconductor device, comprising: a first package comprising a substrate, a first die coupled to the substrate, and a bonding pad over the substrate; a second package comprising a second die; and a frame coupled to the bonding pad and the frame coupled to the second package at a connection point, wherein the connection point is offset from the bonding pad and is located between the first die and the second die. 2. The packaged semiconductor device of claim 1, further comprising a non-conductive layer between the first package and the second package such that the first package directly contacts the non-conductive layer and the second package directly contacts the non-conductive layer without an air gap between the first package and the second package. App. Br. 10. The Examiner maintains the following rejections on appeal: (1) claim 2 under 35 U.S.C. § 112(a) as failing to comply with the written description requirement; (2) claim 1 under 35 U.S.C. § 102(a)(1) as anticipated by Merilo et al.;1 and (3) claims 2—6 under 35 U.S.C. § 103(a) as unpatentable over Merilo in view of Shim et al.2 1 US 7,986,043 B2, issued July 26, 2011 (“Merilo”). 2 US 6,861,288 B2, issued March 1, 2005 (“Shim”). 2 Appeal 2017-001494 Application 14/450,201 B. DISCUSSION 1. Rejection (1) The Examiner finds the following limitation recited in claim 2 lacks written description support: “the first package directly contacts the non- conductive layer and the second package directly contacts the non- conductive layer without an air gap between the first package and the second package.” Final Act. 2. More specifically, the Examiner finds there is no literal support for the claim limitation at issue and finds annotated Figure 4, reproduced below, shows an air gap between the side portions of top/second package 502 and bottom/first package 501. Ans. 2—3, 4.* 3 Examiner’s annotated Figure 4 depicts a block diagram of a package on package structure and identifies an air gap between top package 502 and bottom package 501. 3 Examiner’s Answer dated September 21, 2016. 3 Appeal 2017-001494 Application 14/450,201 In response, the Appellants present an additional annotated Figure 4, reproduced below. Reply Br. 3.* 4 According to the Appellants, in their annotated Figure 4, the dark line originally shown in Figure 4, the text “TOP PACKAGE,” and reference numeral 502 and its bracket are removed. Reply Br. 2. Appellants’ annotated Figure 4 depicts a block diagram of a package on package structure. The Appellants argue that “[a]s can be seen in the edited and annotated Figure 4 , there is no air gap between bottom package 501 and top package 502, only the non-conductive layer 590.” Reply Br. 2. The Appellants argue that the dark line that was removed did not indicate any structure but merely added clarity to the drawing for the associated “top package” and “[l]eadframe molded bottom package” text on the right of original Figure 4. Reply Br. 2. The Appellants’ argument is persuasive of reversible error. As shown in Appellants’ Figure 4, the sides of the encapsulant (not numerically 4 Reply Brief dated November 2, 2016. 4 Appeal 2017-001494 Application 14/450,201 referenced) in bottom package 501 are flush with the sides of non- conductive layer 590, and the sides of the portion of top package 502 that directly contacts non-conductive layer 590 are flush with the sides of layer 590. Thus, contrary to the Examiner’s findings, there is no air gap between the side portions of top package 502 and bottom package 501. The § 112(a) rejection is not sustained.5 2. Rejection (2) Referring to annotated Merilo Figure 1, reproduced below, the Examiner finds Merilo discloses a packaged semiconductor device including a frame comprising leads 104 coupled to a bonding pad of first package 108, 102 and coupled to second package 114 at a connection point (i.e., unnumbered bump on the bottom of package 114), wherein the connection point is offset from the bonding pad and is located between first die 112 and second die 116 as recited in claim 1. Final Act. 3^4; Ans. 4—5. 5 In the event of further prosecution, the Examiner may consider whether the empty spaces above connection points 570 in non-conductive layer 590, depicted in Appellants’ Figure 4, are air gaps. 5 Appeal 2017-001494 Application 14/450,201 N* 4 KJ i offset Examiner’s annotated Merilo Figure 1 depicts a cross-sectional view of an integrated circuit package on package system. In response, the Appellants argue that the connection point (i.e., unnumbered bump on the bottom of package 114) is not between first die 112 and second die 116, but rather is off to the sides of the first and second die. App. Br. 6. The Appellants present an additional annotated Merilo Figure 1, reproduced below, to illustrate their argument. Reply Br. 5. 6 Appeal 2017-001494 Application 14/450,201 Appellants’ annotated Merilo Figure 1 depicts a cross-sectional view of an integrated circuit package on package system. The Appellants’ argument is not persuasive of reversible error. In Merilo, the connection point is located above first die 112 and below second die 116 (i.e., the connection point is between a first die and a second die in a vertical direction). We recognize that the connection point depicted in Appellants’ Figure 4 is located between the first die and the second die in a horizontal direction. However, as in Merilo’s device, the connection point in Appellants’ Figure 4 is also located between a first die and a second die in a vertical direction. Claim 1 recites that “the connection point... is located between the first die and the second die.” App. Br. 10 (emphasis added). Claim 1 does not define whether the term “between” refers to a horizontal direction, a vertical direction, or a combination of horizontal and vertical directions. Thus, giving the term “between” the broadest reasonable interpretation in 7 Appeal 2017-001494 Application 14/450,201 light of the Appellants’ Specification,6 we interpret “between” as encompassing an orientation solely in the vertical direction, i.e., a first die located below the connection point and a second die located above the connection point and the first die. As the Examiner finds, Merilo describes a first die, a second die, and a connection point oriented in that manner. See Examiner’s annotated Merilo Fig. 1. Therefore, the § 102(a)(1) rejection of claim 1 is sustained. 3. Rejection (3) The Examiner finds Merilo does not disclose “a non-conductive layer between the first [108, 102] and second [114] packages such that the first package directly contacts the non-conductive la[y]er and the second package directly contacts the non-conductive la[y]er without an air gap between the first package and the second package” as recited in claim 2. Final Act. 5. The Examiner finds Shim discloses a packaged semiconductor device comprising first/bottom interposer package (126, 118, 108) and second/top package (104, 106) adhesively attached to each other with a conventional electrically non-conductive and thermally conductive layer (202). Final Act. 5. The Examiner finds that in the arrangement disclosed in Shim, a portion of a top surface of the first package directly contacts the non-conductive layer [202] and the second package directly contacts the non-conductive layer at a bottom surface thereof without an air gap between the portion of the top surface of the first package and the bottom surface of the second package. Final Act. 5. 6 See In re Herz, 537 F.2d 549, 551 (CCPA 1976) (“claims are given their broadest reasonable construction consistent with the specification”). 8 Appeal 2017-001494 Application 14/450,201 The Examiner concludes that it would have been obvious to incorporate the non-conductive layer of Shim between the first and second packages of Merilo. Final Act. 5—6. The Appellants do not dispute that it would have been obvious to combine Merilo and Shim as proposed by the Examiner. Rather, the Appellants argue that “the stacked package arrangement of Shim uses solder balls 106 that create an air gap between the bottom package 102 and the top package 104 as can be seen in Figure 2 of Shim.” App. Br. 8. In response, the Examiner finds that solder balls 106 in the second/top package are surrounded by non-conductive layer 202, which removes any air gap between the first/bottom package and the second/top package. Ans. 6 (bold omitted). The Appellants do not direct us to any error in the Examiner’s finding. In the Reply Brief, however, the Appellants argue for the first time on appeal that the Examiner ignores cavity 128 between the first package and the second package, which is the equivalent of the air gap recited in claim 2. Reply Br. 5—6. The Appellants’ argument is not responsive to an argument raised in the Examiner’s Answer (see Ans. 6), and the Appellants do not show good cause why the argument could not have been presented in the Appeal Brief. 37 C.F.R. § 41.41(b)(2) (2015). Therefore, the Appellants’ new argument is untimely and will not be considered on appeal. The Appellants do not present arguments in support of the separate patentability of claims 3—6. Therefore, the § 103(a) rejection of claims 2—6 is sustained. 9 Appeal 2017-001494 Application 14/450,201 C. DECISION The Examiner’s decision to reject claim 2 under 35 U.S.C. § 112(a) as failing to comply with the written description requirement is reversed. The Examiner’s decision to reject claim 1 under 35 U.S.C. § 102(a)(1) as anticipated by Merilo is affirmed. The Examiner’s decision to reject claims 2—6 under 35 U.S.C. § 103(a) as unpatentable over Merilo in view of Shim is affirmed. No time period for taking any subsequent action in connection with this appeal may be extended under 37 C.F.R. § 1.136(a)(1). AFFIRMED 10 Copy with citationCopy as parenthetical citation